Dr Peter C. McKeighan is an expert in mechanical and structural integrity, fatigue and fracture mechanics, failure analysis, solid mechanics, mechanical design and material and mechanical behavior testing.
He is a broadly trained mechanical engineer and has performed numerous design assessments of mechanical systems with a focus on design function, life prediction, damage tolerance and durability and component integrity. In addition, he has performed numerous condition assessments and fitness-for-service evaluations using ASME/API 579. He has both developed and extensively used material lifting and fracture models for transient and time-dependent degradation mechanisms (fatigue, fatigue crack growth, creep and corrosion).
His strong materials background has provided opportunities to be involved with numerous multidisciplinary failure analyses of complex systems and components ranging from consumer products to mechanical equipment to aboveground storage tanks.
He has participated in a wide range of failure analysis projects, which have spanned from simple component failure to large, complex multidisciplinary investigations. These investigations focused on identifying the causal factors involved in the accident and, where possible, identification of the root-cause of failure. These investigations have often included litigation and the required engineering support/testimony.
Dr. McKeighan has been extensively involved in ASTM International for nearly thirty years (including several national leadership positions) having recently received recognition as a Fellow.
Ph.D., Mechanical Engineering, Purdue University, 1991
M.S.M.E., Mechanical Engineering, Purdue University, 1988
B.S.M.E., Mechanical Engineering, Purdue University, 1985
Fellow, ASTM International, 2008
Chairman, Automation and Apparatus (Fatigue and Fracture) Subcommittee ASTM E08.03
Best Paper Award, ASTM Committee E9, 1989 and Best Student Paper Award, ASTM Committee E24, 1992
Pi Tau Sigma; Tau Beta Pi; Phi Eta Sigma
Extensive publication record (~50 referred technical papers, edited symposium and book chapters)